KINDAI UNIVERSITY


*A space between the first name and last name, please enter

YANO Yohko

Profile

FacultyDepartment of Science / Graduate School of Science and Engineering Research
PositionAssociate Professor
Degree
Commentator Guidehttps://www.kindai.ac.jp/meikan/307-yano-youko.html
URL
Mail
Last Updated :2020/04/03

Education and Career

Academic & Professional Experience

  •   2011 04 ,  - 現在, Faculty of Science and Engineering, Department of Science, Kindai University
  •   2008 04 ,  - 2011 03 , Ritsumeikan University
  •   2006 02 ,  - 2007 09 , Ritsumeikan University

Research Activities

Research Areas

  • Natural sciences, Bio-, chemical, and soft-matter physics

Published Papers

  • Development of Simultaneous Measurement System, Mari OKUNO, Syoichi EBATA, Toshiki NISHIKAWA, Yuya OGAWA, Adv. X-Ray. Chem. Anal., Japan, Adv. X-Ray. Chem. Anal., Japan, 50, 161 - 168, Mar. 2019 , Refereed
  • Initial Conformation of Adsorbed Proteins at an Air–Water Interface, Yohko F Yano, Etsuo Arakawa, Wolfgang Voegeli, Chika Kamezawa, Tadashi Matsushita, The Journal of Physical Chemistry B, The Journal of Physical Chemistry B, 122(17), 4662 - 4666, Apr. 2018 , Refereed
  • A quick convergent-beam laboratory X-ray reflectometer using a simultaneous multiple-angle dispersive geometry, Wolfgang Voegeli, Chika Kamezawa, Etsuo Arakawa, Yohko F. Yano, Tetsuroh Shirasawa, Toshio Takahashi, Tadashi Matsushita, JOURNAL OF APPLIED CRYSTALLOGRAPHY, JOURNAL OF APPLIED CRYSTALLOGRAPHY, 50, 570 - 575, Apr. 2017 , Refereed
    Summary:An X-ray reflectometer using a laboratory X-ray source for quick measurements of the specular X-ray reflectivity curve is presented. It uses a bent-twisted crystal to monochromatize and focus the diverging X-rays (Cu K alpha(1)) from a laboratory point source onto the sample. The reflected X-rays are recorded with a two-dimensional detector. Reflectivity curves can be measured without rotating the sample, detector or X-ray source during measurements. The instrument can separate the specularly reflected X-rays from the diffuse scattering background, so low reflectivities can be measured accurately. For a gold thin film on silicon, the reflectivity down to the order of 10(-6) was obtained with a measurement time of 100 s and that down to 10(-5) with a measurement time of 10 s. Reflectivity curves of a silicon wafer and a liquid ethylene glycol surface are shown as well. Time-resolved measurements of a TiO2 surface during UV irradiation are also reported.
  • Hofmeister Anion Effects on Protein Adsorption at an Air-Water Interface, YANO Yohko F, KOBAYASHI Yuki, INA Toshiaki, NITTA Kiyofumi, URUGA Tomoya, Langmuir, Langmuir, 32(38), 9892‐9898, Sep. 27 2016
  • Real-time investigation of protein unfolding at an air-water interface at the 1s time scale, YANO Yohko F, ARAKAWA Etsuo, VOEGELI Wolfgang, MATSUSHITA Tadashi, J Synchrotron Radiat, J Synchrotron Radiat, 20(6), 980 - 983, Nov. 2013
  • Effect of salt ions on protein layers at the air?water interface under a crystallization condition, YANO Yohko F, URUGA Tomoya, Chemical Physics, Chemical Physics, 419, 153 - 155, Apr. 2013
    Summary:The density profiles of lysozyme layers at the air?water interface before and after adding salt were determined
    by X-ray reflection. After adding salt, the density of the lysozyme (LSZ) layers decreases, whereas
    the thickness drastically increases. The salt ions are considered to increase the LSZ?LSZ interaction, and
    consequently decrease the surface activity of LSZ, allow adsorbed lysozyme molecules crystallize.
  • X-ray Reflectivity Measurements for Freezing Transitions of Alkane Wetting Film on Surfactant Solution Surface, MATSUBARA Hiroki, TAKAICHI Tetsumasa, TAKIUE Takanori, TANIDA Hajime, URUGA Tomoya, YANO Yohko F, ARATONO Makoto, Bull Chem Soc Jpn, Bull Chem Soc Jpn, 86(4), 492-496 (J-STAGE), 2013
  • A simultaneous multiple angle-wavelength dispersive X-ray reflectometer using a bent-twisted polychromator crystal, MATSUSHITA Tadashi, ARAKAWA Etsuo, VOEGELI Wolfgang, YANO Yohko F, J Synchrotron Radiat, J Synchrotron Radiat, 20(1), 80 - 88, Jan. 2013
  • Kinetics of protein unfolding at interfaces, J. Phys.: Condens. Matter, J. Phys.: Condens. Matter, 24, 50310, Dec. 2012
    Summary:The conformation of protein molecules is determined by a balance of various forces, including
    van der Waals attraction, electrostatic interaction, hydrogen bonding, and conformational
    entropy. When protein molecules encounter an interface, they are often adsorbed on the
    interface. The conformation of an adsorbed protein molecule strongly depends on the
    interaction between the protein and the interface. Recent time-resolved investigations have
    revealed that protein conformation changes during the adsorption process due to the
    protein?protein interaction increasing with increasing interface coverage. External conditions
    also affect the protein conformation. This review considers recent dynamic observations of
    protein adsorption at various interfaces and their implications for the kinetics of protein
    unfolding at interfaces.
  • Simultaneous measurement of X-ray specular reflection and off-specular diffuse scattering from liquid surfaces using a two-dimensional pixel array detector: the liquid-interface reflectometer of BL37XU at SPring-8, Yohko F. Yano, Tomoya Uruga, Hajime Tanida, Hidenori Toyokawa, Yasuko Terada, Hironari Yamada, J. Synchrotron Rad., J. Synchrotron Rad., 17(4), 511 - 516, 2010
  • X-ray specular and off-specular reflection from a protein adsorbed at a liquid surface, Yohko F. Yano, Tomoya Uruga, Hajime Tanida, Hidenori Toyokawa, Yasuko Terada, Masafumi Takagaki, Hironari Yamada, Trans. MRS-J, Trans. MRS-J, 34, 631 - 638, 2009
  • Driving Force behind Adsorption-Induced Protein Unfolding: A Time-Resolved X-ray Reflectivity Study on Lysozyme Adsorbed at an Air/Water Interface, Yohko F. Yano, Tomoya Uruga, Hajime Tanida, Hidenori Toyokawa, Yasuko Terada, Masafumi Takagaki, Hironari Yamada, Langmuir, Langmuir, 25(1), 32 - 35, 2009
  • Rapid x-ray reflectivity measurement using a new liquid interface reflectometer at SPring-8, Yohko F. Yano, Tomoya Uruga, Hajime Tanida, Hidenori Toyokawa, Yasuko Terada, Masafumi Takagaki, Hironari Yamada, Eur. Phys. J. Special Topics, Eur. Phys. J. Special Topics, 167, 101 - 105, 2009
  • Surface structure of a neat ionic liquid investigated by grazing incidence X-ray diffraction, Yohko F. Yano, Hironari Yamada, Anal. Sci,, Anal. Sci,, 24(10), 1269 - 1271, 2008
  • Small-angle X-ray scattering measurement of a mist of ethanol nanodroplets: An approach to understanding ultrasonic separation of ethanol-water mixtures, Yohko F. Yano, Kazuo Matsuura, Tetsuo Fukazu, Fusatsugu Abe, Akihiro Wakisaka, Hitomi Kobara, Kazuyuki Kaneko, Atsushi Kumagai, Yoshio Katsuya, Masahiko Tanaka, J. Chem. Phys.(commun.), J. Chem. Phys.(commun.), 127(3), 031101, 2007

Misc

  • Development of a quick laboratory X-ray reflectometer for time-resolved observations, VOEGELI W, KAMEZAWA C, KAMEZAWA C, ARAKAWA E, MATSUSHITA T, YANO Yohko F, Program Abstr ISSS (CD-ROM), 7th, ROMBUNNO.6PN-97,   2014 , http://jglobal.jst.go.jp/public/201502204657085124
  • Quick X-ray refiectivity measurements using a monochromatic X-ray source, VOEGELI Wolfgang, MATSUSHITA Tadashi, ARAKAWA Etsuo, YANO Yohko F, 日本放射光学会年会・放射光科学合同シンポジウム予稿集, 26th, 57,   2013 01 12 , http://jglobal.jst.go.jp/public/201302282481803276
  • X-ray reflectivity from liquid surfaces using a simultaneous multiple angle-wavelength dispersive x-ray reflectometer, YANO Yohko F, ARAKAWA Etsuo, VOEGELI Wolfgang, MATSUSHITA Tadashi, Abstr JSAP MRS Jt Symp (CD-ROM), ROMBUNNO.17P-PM2-10,   2013 , http://jglobal.jst.go.jp/public/201302285849183426
  • Time-resolved observation of electrochemical thin-film growth by X-ray reflectivity, VOEGELI Wolfgang, MATSUSHITA Tadashi, ARAKAWA Etsuo, YANO Yohko F, 応用物理学会学術講演会講演予稿集(CD-ROM), 73rd, ROMBUNNO.12A-PB1-13,   2012 08 27 , http://jglobal.jst.go.jp/public/201202208002869591
  • Development of a method for fast X-ray reflectivity measurements using a laboratory characteristic X-ray source, VOEGELI Wolfgang, MATSUSHITA Tadashi, ARAKAWA Etsuo, YANO Yohko F, 応用物理学会学術講演会講演予稿集(CD-ROM), 73rd, ROMBUNNO.12A-C3-6,   2012 08 27 , http://jglobal.jst.go.jp/public/201202226772682080
  • Time-Resolved X-Ray Reflectometry in the Multiwavelength Dispersive Geometry, MATSUSHITA Tadashi, ARAKAWA Etsuo, HARADA Tetsuo, HATANO Tadashi, HIGASHI Yasuo, YANO Yohko F, NIWA Yasuhiro, INADA Yasuhiro, NAGANO Shusaku, SEKI Takahiro, AIP Conf Proc, 1234, 927, 930,   2010 , 10.1063/1.3463368, http://jglobal.jst.go.jp/public/201202216080460139
  • Folding and Unfolding of Human Lactoferrin at Interfaces: Expected X-ray Reflectivity Profiles, YANO Yohko F, Trans Mater Res Soc Jpn, 32, 1, 251, 254,   2007 03 , http://jglobal.jst.go.jp/public/200902263840317636
  • Protein unfolding at a liquid/vapor interface observed by x-ray reflection, YANO Yohko F, URUGA Tomoya, TANIDA Hajime, TOYOKAWA Hidenori, TERADA Yasuko, TAKAGAKI Masashi, 溶液化学シンポジウム講演要旨集, 30th, 154,   2007 , http://jglobal.jst.go.jp/public/200902222779665466
  • In situ x-ray diffraction measurements of the capillary fountain jet produced via ultrasonic atomization, YANO Yohko F, DOUGUCHI Junya, KUMAGAI Atsushi, IIJIMA Takao, TOMIDA Yukinobu, MIYAMOTO Toshiaki, MATSUURA Kazuo, J Chem Phys, 125, 17, 174705-174705-4,   2006 11 07 , 10.1063/1.2363188, http://jglobal.jst.go.jp/public/200902210753087512
  • Critical Casimir Effect in Three-Dimensional Ising Systems: Measurements on Binary Wetting Films, FUKUTO Masafumi, YANO Yohko F, PERSHAN Peter S, Phys Rev Lett, 94, 13, 135702.1-135702.4,   2005 04 08 , 10.1103/PhysRevLett.94.135702, http://jglobal.jst.go.jp/public/200902295782520484
  • Correlation between surface and bulk structures of alcohol-water mixtures, YANO Yohko F, J Colloid Interface Sci, 284, 1, 255, 259,   2005 , 10.1016/j.jcis.2004.09.059, http://jglobal.jst.go.jp/public/200902245878153299